9

Thermal imaging using the atomic force microscope

Year:
1993
Language:
english
File:
PDF, 641 KB
english, 1993
19

The Origin of the Berreman Effect in SiC Homostructures

Year:
1998
Language:
english
File:
PDF, 131 KB
english, 1998
21

Detection of subsurface voids using scanning thermal microscopy

Year:
1999
Language:
english
File:
PDF, 382 KB
english, 1999
22

Students' mathematical modeling of motion

Year:
2008
Language:
english
File:
PDF, 194 KB
english, 2008
40

Thermal detection of device failure by atomic force microscopy

Year:
1995
Language:
english
File:
PDF, 283 KB
english, 1995